EMIL

SISSY-off Synctrotron Analysis

The off-synchrotron analysis chamber is equipped with a lab-based x-ray and (laser-driven) UV sources to allow for (pre-)characterization of the sample under consideration with UV and x-ray photoemission spectroscopy and constant-final state yield spectroscopy.

In addition to the analytic capabilities, a wide control over the sample environment is available, including controlled continuous temperature variation from -180°C to 1500°C and the application of electronic biases to samples during measurement. The available preparation chamber(s) house evaporators for organic and metallic thin film deposition that can be used, for example, to study the formation of electrical contact layers.