Pietzsch, A.: The μmRIXS spectrometer at BESSY II. Journal of Large Scale Research Facilities JLSRF 2 (2016), p. A-72
10.17815/jlsrf-2-80
Open Access Version
Abstract:
The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.