UE46_PGM-1
UE46_PGM-1
UE46_PGM-1 is one of two beamlines situated at the elliptical undulator UE46. The beamline provides soft x-rays with tunable polarization (linear, circular) in the energy range between 120 eV and 2000 eV. It has a plane-grating design, the last mirror chamber hosts two mirrors that can be switched to provide a focussed or collimated beam.
Beamline data | |
---|---|
Segment | L10 |
Location (Pillar) | 11.2 |
Source | UE46 (Elliptical Undulator) |
Monochromator | PGM |
Energy range | 120 - 2000 eV |
Energy resolution | 10 000 |
Flux | 1012 |
Polarisation |
|
Divergence horizontal | 1 mrad |
Divergence vertical | 1 mrad |
Focus size (hor. x vert.) |
|
User endstation | not possible |
Distance Focus/last valve | 565 mm |
Height Focus/floor level | 1417 mm |
Beam availability | 12h/d |
Phone | +49 30 8062 14717 |
Applicable station(s) | |
High-Field Diffractometer | 4 - 350 K |
XUV Diffractometer | 3.8 - 320 K ( for T = 3.0 K contact Instrument Scientists) |
UE46_PGM-1 is one of two beamlines situated at the elliptical undulator UE46. The beamline provides soft x-rays with tunable polarization (linear, circular) in the energy range between 120 eV and 2000 eV. It has a plane-grating design, the last mirror chamber hosts two mirrors that can be switched to provide a focussed or collimated beam. Techniques employed at UE46_PGM-1 include polarization-dependent x-ray absorption and resonant soft x-ray scattering experiments, covering a wide range of materials and scientific problems. Continuous-mode scanning is implemented at the beamline, a pair of energy-dependent x-ray absorption scans with opposite light helicities can be recorded with very high quality within less than 10 minutes. Depending on the sample, noise ratios as low as 10-4 can be achieved. The beamline hosts two permanent endstations, the XUV Diffractometer, an instrument dedicated to high performance RSXS studies and the High-Field Diffractometer, an instrument for RSXS and XAS studies in magnetic fields up to 7 Tesla. Both instruments can be used within the same beam time. Beamline and instruments are operated by the Institute Quantum Phenomena in Novel Materials at HZB.
Selected Applications
- Resonant diffraction from magnetic, charge, and orbital order superstructures
- Spectroscopy of electronic ordering phenomena
- Magnetization states of single molecular magnets
- Element-specific magnetic hysteresis loops
- Magnetization depth profiles
Selected Publications
- Bluschke, M.; Frano, A.; Schierle, E.; Minola, M.; Hepting, M.; Christiani, G.; Logvenov, G.; Weschke, E.; Benckiser, E.; Keimer, B.: Transfer of Magnetic Order and Anisotropy through Epitaxial Integration of 3d and 4f Spin Systems. Physical Review Letters 118 (2017), p. 207203/1-5
- Sánchez-Barriga, J.; Varykhalov, A.; Springholz, G.; Steiner, H.; Kirchschlager, R.; Bauer, G.; Caha, O.; Schierle, E.; Weschke, E.; Uenal, A. A.; Valencia, S.; Dunst, M.; Braun, J.; Ebert, H.; Minar, J.; Golias, E.; Yashina, L.V.; Ney, A.; Holy, V.; Rader, O.: Nonmagnetic band gap at the Dirac point of the magnetic topological insulator (Bi1-xMnx)2Se3. Nature Communications 7 (2016), p. 10559/1-10
- Frano, A.; Blanco-Canosa, S.; Schierle, E.; Lu, Y.; Wu, M.; Bluschke, M.; Minola, M.; Christiani, G.; Habermeier, H.U.; Logvenov, G.; Wang, Y.; van Aken, P.A.; Benckiser, E.; Weschke, E.; Le Tacon, M.; Keimer, B.: Long-range charge-density-wave proximity effect at cuprate/manganate interfaces. Nature Materials 15 (2016), p. 831-835
- Bernien, M.; Naggert, H.; Arruda, L.M.; Kipgen, L.; Nickel, F.; Miguel, J.; Hermanns, C.F.; Krüger, A.; Krüger, D.; Schierle, E.; Weschke, E.; Tuczek, F.; Kuch, W.: Highly Efficient Thermal and Light-Induced Spin-State Switching of an Fe(II) Complex in Direct Contact with a Solid Surface. ACS Nano 9 (2015), p. 8960-8966
- Comin, R.; Frano, A.; Yee, M.M.; Yoshida, Y.; Eisaki, H.; Schierle, E.; Weschke, E.; Sutarto, R.; He, F.; Soumyanarayanan, A.; He, Y.; Le Tacon, M.; Elfimov, I.S.; Hoffman, J.E.; Sawatzky, G.A.; Keimer, B.; Damascelli, A.: Charge Order Driven by Fermi-Arc Instability in Bi2Sr2-xLaxCuO6+δ. Science 343 (2014), p. 390-392
- Fink, J.; Schierle, E.; Weschke, E.; Geck, J.: Resonant elastic soft x-ray scattering. Reports on Progress in Physics 76 (2013), p. 056502/1-59