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  Miedema, P.S.; Beye, M.; Könnecke, R.; Schiwietz, G.; Föhlisch, A.: The angular- and crystal-momentum transfer through electron-phonon coupling in silicon and silicon carbide: similarities and differences. New Journal of Physics 16 (2014), p. 093056/1-15

10.1088/1367-2630/16/9/093056
Open Access Version (externer Anbieter)

Abstract:
Electron–phonon scattering has been studied for silicon carbide (6H-SiC) with resonant inelastic x-ray scattering at the silicon 2p edge. The observed electron– phonon scattering yields a crystal momentum transfer rate per average phonon in 6H-SiC of 1.8 fs−1 while it is 0.2 fs−1 in crystalline silicon. The angular momentum transfer rate per average phonon for 6H-SiC is 0.1 fs−1, which is much higher than 0.0035 fs−1 obtained for crystalline silicon in a previous study. The higher electron–phonon scattering rates in 6H-SiC are a result of the larger electron localization at the silicon atoms in 6H-SiC as compared to crystalline silicon. While delocalized valence electrons can screen effectively (part of) the electron–phonon interaction, this effect is suppressed for 6H-SiC in comparison to crystalline silicon. Smaller contributions to the difference in electron–phonon scattering rates between 6H-SiC and silicon arise from the lower atomic mass of carbon versus silicon and the difference in local symmetry.