Rubensson, J.-E.; Söderström, J.; Binggeli, C.; Grasjö, J.; Andersson, J.; Sathe, C.; Hennies, F.; Bisogni, V.; Huang, Y.; Olalde, P.; Schmitt, T.; Strocov, V. N.; Föhlisch, A.; Kennedy, B.; Pietzsch, A.: Rydberg-Resolved Resonant Inelastic Soft X-Ray Scattering: Dynamics at Core Ionization Thresholds. Physical Review Letters 114 (2015), p. 133001/1-5
10.1103/PhysRevLett.114.133001
Open Access Version (externer Anbieter)
Abstract:
Resonant inelastic x-ray scattering spectra excited in the immediate vicinity of the core-level ionization thresholds of N2 have been recorded. Final states of well-resolved symmetry-selected Rydberg series converging to valence-level ionization thresholds with vibrational excitations are observed. The results are well described by a quasi-two-step model which assumes that the excited electron is unaffected by the radiative decay. This threshold dynamics simplifies the interpretation of resonant inelastic x-ray scattering spectra considerably and facilitates characterization of low-energy excited final states in molecular systems