KMC-2 XANES
XANES, EXAFS, myXANES, myEXAFS
The KMC-2 XANES is dedicated to investigate the short-range environment around selected atomic species in condensed matter by X-ray Absorption Spectroscopy. It provides linear polarized light at 4 – 15 keV photon energy for EXAFS, XANES and X-ray fluorescence measurements at-air. The detector system consists of three ionization chambers, Si-PIN photodiode, energy-dispersive detector (Bruker X-Flash 6|60) and scintillation counter. The experimental setup allows for a parallel monitoring of the X-ray beam intensity transmitted through the sample as well as fluorescence yield measurements.
Selected Applications:- investigate the short-range environment around selected atomic species in condensed matter
- study structural properties in various materials like: liquids, molecular solutions, liquid crystals; single- and poly-crystalline materials; amorphous and highly disordered solids; molecules and macromolecules containing metallic atoms or partially substituted with heavy atoms
Methods
NEXAFS, XRF, XRF Mapping, EXAFS
Remote access
not possible
| Beamline data | |
|---|---|
| Energy range | 4 - 15 keV |
| Energy resolution | 1/4000 |
| Flux | dipole, 1e7 - 1e10 |
| Polarisation | linear horizontal |
| Focus size (hor. x vert.) | 250 μm x 600 μm (4.8 μm x 4.8 μm with capillary optics; at XANES only, not available at Diffraction) |
| Phone | +49 30 8062 14623 |
| More details | KMC-2 |
| Station data | |
| Temperature range | 293 K |
| Pressure range | For details contact the station manager. |
| Detector | Bruker X-Flash 6|60, 3 ionization chambers, Si-PIN photodiodes |
| Manipulators | Huber goniometer |
| Sample holder compatibility |
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| Additional equipment |
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Instrument description
The KMC-2 XANES is a dedicated endstation to investigate the short-range environment around selected atomic species in condensed matter by X-ray Absorption Spectroscopy. This end-station provides possibility for EXAFS, XANES and X-ray fluorescence measurements at-air. The detector system consists of three ionization chambers, Si-PIN photodiode, energy-dispersive detector (Bruker X-Flash 6|60) and scintillation counter. The experimental setup allows for a parallel monitoring of the transmitted through the sample X-ray beam intensity as well as for fluorescence yield measurements. This end-station is permanently attached to the KMC-2 beamline providing medium photon flux between 4000 eV and 15000 eV and linear photon polarization, necessary to exploit the potential of X-ray absorption spectroscopy.
Instrument application
X-ray Absorption Spectroscopy (XAS) is a powerful structural technique to investigate the short-range environment around selected atomic species in condensed matter. While scanning the x-ray energy impinging onto the sample, a core level photoelectron is generated. This is scattered by the surroundings matter producing interference effects visible in the absorption cross-section and usually referred to as x-ray absorption fine structure (XAFS). The process itself is general and therefore fundamental to study structural properties in materials like:
• liquids, molecular solutions, liquid crystals;
• single- and poly-crystalline materials;
• amorphous and highly disordered solids;
• molecules and macromolecules containing metallic atoms or partially substituted with heavy atoms.
The energy range 4.0 keV < E < 15 keV is sufficient for K-edge studies of elements in the range 21 < Z < 36 and L-edge studies of elements in the range 49 < Z < 83. The sample thicknesses for experiments are in the µm range for transmission experiments. However, thin film and/or dilute systems studies are still possible in fluorescence mode.