Schunck, J.O.; Döring, F.; Rösner, B.; Buck, J.; Engel, R.Y.; Miedema, P.S.; Mahatha, S.K.; Hoesch, M.; Petraru, A.; Kohlstedt, H.; Schüssler-Langeheine, C.; Rossnagel, K.; David, C.; Beye, M.: Soft X-ray imaging spectroscopy with micrometer resolution. Optics Letters 8 (2021), p. 156-160
10.1364/OPTICA.405977
Open Accesn Version
Abstract:
Soft X-ray spectroscopy is invaluable for gaining insights into quantum materials. However, it is typically conducted in a spatially averaging way, making it blind towards inhomogeneity in samples. Here, we demonstrate how we couple imaging with a spatial resolution...