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Institute Silicon Photovoltaics

Analytical Methods

This page provides an overview of the available characterization techniqes

Molecular spectroscopy

For the determination of the chemical structure the following techniqes are available:

> Raman-spectroscopy
> Infrared-spectroscopy (FTIR)

Characterization of surfaces

Photoelectron spectroscopy
Surface Photovoltage (SPV)
AFM

Optical Methods

Spectroscopic Ellipsometry
UV/VIS/NIR spectroscopy
Photoluminescence

Solarcell- and Semiconductor Characterization

Capacitance-Voltage measurements (CV & DLTS)
I(V) measurements
SunsVoc

Morphology

Scanning Electron Microscopy (SEM)
Scanning Force Microscopy
Stylus profiler in the 12.8 cleanroom