Institute Silicon Photovoltaics
NUV photoelectron spectroscopy
Photoelectron spectroscopy (PES) makes use of the external photoeffect to investigate the structure and electronic properties of materials.
Investigated materials
- amorphous an nanocrystalline silicon
- SiOx /SiO2
- transparent conductive oxides: ITO, ZnO, WOx, InWOx, ...
- organic semiconductor thin films, e.g. PEDOT:PSS
Selected References
| L. Korte & M. Schmidt, J. Appl. Phys. 109 (2011) 063714-1-6. |
| L. Korte & M. Schmidt, J. Non-Cryst. Sol. 354 (2008) 2138-43. |
| L. Korte; A. Laades & M. Schmidt, J. Non-Cryst. Sol. 352 (2006) 1217-20. |
| M. Schmidt; A. Schoepke; L. Korte; O. Milch & W. Fuhs, J. Non-Cryst. Sol. 338-340 (2004) 211-214 |
| B. Johnson; L. Korte; T. Lussky; J. Klaer & I. Lauermann, J. Appl. Phys. 106 (2009) 073712-6. |
| T.F. Schulze; L. Korte; F. Ruske & B. Rech, Phys. Rev. B 83 (2011) 165314. |
| M. Liebhaber; M. Mews; T.F. Schulze; L. Korte; B. Rech & K. Lips, Appl. Phys. Lett. 106 (2015) 031601. |
| M. Mews; L. Korte & B. Rech, Sol. En. Mat. and Sol. C. 158 (2016) 77-8 |